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23rd IEEE European Test
Symposium |
CALL FOR PAPERS
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The IEEE European Test Symposium (ETS) is Europe’s premier forum dedicated to presenting and discussing scientific results, emerging ideas, applicatioons, hot topics, and new trends in the area of electronic-based circuit and system testing and reliability. In 2018, ETS will take place at Swissôtel, Bremen, Germany. It is organized by the University of Bremen, which co-sponsors the event jointly with the IEEE Council on Electronic Design Automa on (CEDA). ETS traditionally enjoys a strong balance among academic and industrial participants. In addition to regular Scientific Papers, Special Sessions, Panels, and Embedded Tutorials, ETS features Vendor Sessions and Table-Top Demos as well as a special track on Emerging Test Strategies (ETS2) where new issues are presented by the industry and are discussed in an informal atmosphere. ETS is the major event of the European Test Week, which includes TSS (Test Spring School) and fringe workshops. You are invited to participate and submit your contributions to ETS’18. The following topic chairs have been selected to put particular emphasis on their topic: P. Bernardi: Microprocessor and On-line Test, K. Chakrabarty: Emerging Technologies in Test, P. Girard: Power Issues in Test, S. Hamdioui: Memory and Nanotechnology Test, E. Larsson: Test Architectures and Standards, G. Léger: Analog/Mixed Signal Test, M. Maniatakos: Security and Trust Issues in Test, I. Polian: Test Generation and Reliability, J. Rivoir: Automatic Test Equipment and Yield, C. Scholl: Validation and Verification, A. Singh: Defect-based Test and Variability. In summary, areas of interest include (but are not limited to):
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Publication – ETS‘18 will produce electronic formal proceedings with ISBN number to be indexed in the IEEE Xplore Digital Library and other bibliographical search engines. Submissions – ETS’18 seeks: Scientific Papers for the Formal Proceedings, presenting novel, unpublished, and complete research work. Prospective authors should be aware that ETS’18 fully complies with the IEEE publication policies regarding multiple submissions, plagiarism, etc. ETS’18 also seeks proposals for:
Key dates regarding the submission of proposals in the above categories can be found on the website. |
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Additional Information | |
General co-Chairs Stephan Eggersglüß Program Chair |
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Committee | |
General Chairs
General Vice-Chair
Program Chair
Program Vice-Chair
Topic Chairs
ETS2 Chairs
Panel Chairs
Embedded Tutorial Chairs
Special Session Chairs
Industrial Relations Chairs
Publica on Chairs
Web & Electronic Media Chairs
Publicity Chairs
Award Chairs
ETS Fringe Workshops
Regional Liaisons
TSS (Test Spring School) Chairs
TSS Local Chair
Steering Committee
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For more information, visit
us on the web at: www.ets18.de
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The 23rd IEEE European Test Symposium is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC). |
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IEEE Computer Society-Test
Technology Technical Council
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